Advanced Solutions For IC And Board Level Test And Burn-In
For over 20 years Accutron has been providing scalable test and burn-in systems to major multinational semiconductor manufacturing facilities and their integrators worldwide. We provide a complete design and customisation service for our test and burn-in solutions, for both low and high-volume applications. We take a systematic and innovative approach to our client’s hardware design requirements. From concept design, system specification through to prototyping and evaluation, we will manage the whole process.
Modular Burn-In Test Drivers
Dynamic Digital I/O & Analogue I/O Driver Boards
Accutron provides highly configurable modular test solutions to suit your application & budget. Our scalable FlexBID system provides digital and analog boards that can be individually architected to meet your specific burn-in requirements.
FlexBID FEATURES
Up to 384 synchronised digital channels per driver
Up to 128 analog channels
Up to 16GB of pattern memory per module.
Integrated voltage and current monitoring
Integrated power supply control
Gbit LAN connection to the PC for high speed control.
Supplied with test development and automation software with an easy to use graphics based development & control environment.
ADDITIONAL OPTIONS FOR FASTER INTEGRATION
We supply custom interface boards for custom digital and analog configurations for fast & simple integration. We also provide custom oven feed-through boards. We can provide a rack based bench-top unit for burn-in program development and debug.
Functional Test Systems
Benchtop ATE Systems
Accutron develops and builds test fixtures tailored to your individual PCB test requirements. Our benchtop functional testers can test analog, digital and hybrid boards under dynamic operating conditions using our software for test generation and operation.
FEATURES
Shorts and opens pre-test.
Analog, digital and hybrid board test.
Test one or multiple different boards in one fixture.
Integrated switching high current and high voltage test options.
Pogo pin and/or cable connect test interface.
Integrated flash programming options.
JTAG, BIST and Structural Test options.
External or embedded control PC options.
Custom test application and user interface development service.
INTERCHANGEABLE CASSETTE OPTION
Removable test cassette modules with unique software ID technology enables rapid UUT interchange.
